28-SOIC
IC SCAN TEST DEVICE 28-SOIC
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Quantity:
1808Y2000271GFT
Knowles Syfer
PC912L0NSZ
Sharp Microelectronics
7-2151905-7
TE Application Tooling
2035590707
Molex
FCO7C049333A3CBY00
Fuji Crystal (Hong Kong) Electronics Co., Limited
