Texas Instruments
Product No:
SNJ54BCT8374AFK
Manufacturer:
Package:
28-LCCC (11.43x11.43)
Batch:
-
Description:
SCAN TEST DEVICES WITH OCTAL D-T
Quantity:
Delivery:

Payment:
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| Series | 54BCT |
| Operating Temperature | -55°C ~ 125°C |
| Package / Case | 28-CLCC |
| Logic Type | Scan Test Device with D-Type Edge-Triggered Flip-Flops |
| Mfr | Texas Instruments |
| Supply Voltage | 4.5V ~ 5.5V |
| Number of Bits | 8 |
| Package | Tube |
| Mounting Type | Surface Mount |
| Product Status | Active |
| Supplier Device Package | 28-LCCC (11.43x11.43) |